OES/ESD – Basics of EOS/EIPD/AMR

When:
May 18, 2021 @ 10:00 am – 11:00 am
2021-05-18T10:00:00-07:00
2021-05-18T11:00:00-07:00
Where:
webinar

https://us02web.zoom.us/meeting/register/tZEsduigrTstG9HfgE30Y0LGbkDn-K-_nZhL

By Matt Jane and Reinhold Gaertner

Many electronics industry professionals have experienced an electrical failure with their products. Often the root cause assigned is ‘EOS – Electrical Overstress’ or ‘EIPD – Electrically Induced Physical Damage’ based on the failure analysis images. What does this really mean? EOS-like damages represent a significant percentage of failed com­ponents throughout the entire electronics industry. The Industry Council has published White Paper 4 improving the definitions of EOS and EIPD to standardize communication across the industry. Does this document help to find the root cause of EOS and EIPD issues?

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