By Vincent C. Pascucci
Since the 1980s there has been enormous growth in the use of electronic devices which has driven similar, if not greater, growth in the number of electrical interconnects. As we become more dependent on these devices the need to ensure their reliability becomes more important. Two factors complicate this effort. The first is the reduction in size of electrical contacts and the commensurate reduction in contact normal force available to ensure a stable interface. The other factor is that reliability is not free. Thus, as the number of interconnects increases, cost considerations drive a need to ensure the reliability of connectors is matched to the needs of their specific applications. Testing protocols to help achieve this match will be discussed in this presentation.