SMTA – Defect Detection for Advanced Wafer and Package Devices

When:
September 18, 2020 @ 10:00 am – 11:00 am
2020-09-18T10:00:00-07:00
2020-09-18T11:00:00-07:00
Where:
webinar

https://smta.org/events/EventDetails.aspx?id=1416235&group=

The SMTA Capital Chapter is excited to host a FREE webinar Friday, September 18th on “Defect Detection for Advanced Wafer and Package level devices using Scanning Acoustic Microscopy.” The webinar will be given by James C.P. McKeon, Ph.D, Director of Technology at Sonix, Inc.

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