Huairui Guo
May 11, 2014 / 10am China time

An ASQ RD Chinese language webinar

With components becoming more and more reliable, it is harder to obtain failures through in house testing even at elevated stresses. Most failures are caused by degradation of materials and devices. For reliability evaluation purposes, it is important to investigate how critical material parameters and performance characteristics degradation with time. If a model describing the degradation process very well can be found, then this model can be used to evaluate the product reliability without waiting actual failures to occur. In many engineering applications, this approach provides significant savings in time and costs. In this seminar, we will discuss some practical approaches to degradation data modeling. Topics include the follows: pseudo failure time method, random process method, degradation processes with initiation time, and destructive degradation.

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