OALC webinar New Tools for Electronic Product Stress analysis

May 14, 2014 @ 12:00 pm – 1:00 pm

May 14, 2014: FREE Webinar 12-1pm PST


Title: New Tools for Electronic Product Stress Analysis
Speaker: John Cooper
Date: Wednesday, May 14, 2014 (12-1pm PST)

This Webinar will present tools, including some new ones, used for analyzing product reliability. Electronic Stress Analysis (ESA) and Derating looks at how electrical circuit loading can shorten the life of the product. Similarly, by looking at some aspects of the actual circuit signals we can often show we have over-estimated the impact of circuit stresses; this information can be incorporated to improve the accuracy of the prediction, which often results in increased estimates MTBF. In addition, we will look at the stress factors associated with high power circuit elements, and methods for reducing the stresses in the circuit. Finally, we’ll look at some methods used in life predictions and what they mean for your MTBF!

Join us for an in-depth exploration of these techniques and how to employ them. Bring your questions- “yah-buts” are encouraged!

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