(IPFA) International Symposium on the Physical and Failure Analysis of Integrated Circuits

When:
July 20, 2020 – July 23, 2020 all-day
2020-07-20T00:00:00-07:00
2020-07-24T00:00:00-07:00
Where:
Singapore

https://www.ipfa-ieee.org/2020/

IPFA will continue to focus on the fundamental understanding of the electrical and physical characterization techniques and associated technologies that assist in probing the nature of wear-out and failure in conventional and new CMOS devices, in turn resulting in improved knowhow of the physics of device / circuit / module failure that serves as critical input for future design for reliability.

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