IEEE Asian Test Symposium (ATS)

When:
December 10, 2019 – December 13, 2019 all-day
2019-12-10T00:00:00-08:00
2019-12-14T00:00:00-08:00
Where:
Kolkata
India

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The Asian Test Symposium (ATS) provides an open forum dedicated to the electronic test of devices, boards and systems—covering the complete test cycle from design verification, design-for- test, design-for- manufacturing, silicon debug, manufacturing test, system test, diagnosis, reliability and failure analysis, and back to process and design improvement. The main goal of organizing IEEE Asian Test Symposium (ATS 2019) is to promote discussions and scientific exchange of knowledge between researchers, developers, engineers, academicians and students working in India and abroad. At ATS 2019, the design, test, and yield challenges faced by the industry are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers.

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