By Dr. Rong Pan
Accelerated life testing (ALT) is a direct approach to obtain product failure time information and is widely employed in the product development and reliability improvement process. Companies may use ALTs for multiple purposes such as quantifying the failure time acceleration factor for specific environmental stress variable, validating a stress-lifetime relationship, and predicting some reliability measures under normal use condition, etc. In this webinar we will first give a thorough presentation of different ALT plans and the varying data forms generated from ALTs. In order to draw valid conclusions from ALT data, proper statistical analysis methods must be chosen. Therefore, we will study both lifetime distribution models and lifetime regression models and demonstrate their usefulness in ALT data analysis.
We will show the impact of failure time censoring on distribution parameter estimation and how to select a good regression model from both the physics-of-failure and goodness-of-fit perspectives. This webinar will also provide hands-on exercises using JMP and R. All software codes and step-by-step instructions will be provided to attendees before the webinar.