DFR – Radiation Effects on Integrated Circuits

When:
September 16, 2020 @ 8:00 am – 9:00 am
2020-09-16T08:00:00-07:00
2020-09-16T09:00:00-07:00
Where:
webinar

https://register.gotowebinar.com/register/3665368654932374287

Among the different issues affecting the reliability of semiconductor components in critical systems, radiation effects have always been a concern. It plays a major role not only for space borne but emerging applications in terrestrial environments as well. In this webinar, we will present the susceptibility of ICs to two main radiation effects, total ionizing dose (TID) and single event effects (SEE), reliability prediction using simulation methods from a perspective of design, process technology and environment.

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