DFR – Physics-of-Failuire and Reliability of Power Semiconductors

When:
November 19, 2019 @ 8:00 am – 9:00 am
2019-11-19T08:00:00-08:00
2019-11-19T09:00:00-08:00
Where:
webinar

https://www.dfrsolutions.com/physics-of-failure-and-reliability-of-power-semiconductors

By Ashok Alagappan

Board Level Reliability Testing (BLRT) encompasses a range of environmental stress tests that evaluate Power devices are one of the most important and widely used components in industrial and automotive applications. Parameters that justify their use such as faster switching speeds, high breakdown voltage, and high ruggedness could be compromised by reliability issues arising from the manufacturing process and field application. In this webinar, Ashok Alagappan, Lead Consulting Engineer at ANSYS Inc., will discuss common device types, their characteristics and reliability challenges.

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